Get current pricing for Kla-tencor P-2 Long Scan, KLA-Tencor P-2 Long Scan-48287-ID Ability To Measure Micro-roughness With 1 Angstrom Over Short Distances As Well As Waviness Over A Full 210mm Scan Measure Waviness Over A Full 8&quo . Product Category: Semiconductor, Sub Category: Metrology And Inspection:

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Manufacturer: Kla-tencor P-2 Long Scan Part number: KLA-Tencor P-2 Long Scan-48287-ID Description: Ability To Measure Micro-roughness With 1 Angstrom Over Short Distances As Well As Waviness Over A Full 210mm Scan Measure Waviness Over A Full 8&quo . Product Category: Semiconductor, Sub Category: Metrology And Inspection

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